Articles Tagged with ''GaN''

New Cree GaN HEMT die available via distribution

 Cree, Inc. has made seven new GaN HEMT die available through distribution via Mouser. Manufactured on silicon carbide (SiC) substrates using a either 0.4 or 0.25 μm gate length fabrication process, the gallium nitride (GaN) high electron mobility transistor (HEMT) die exhibit superior performance properties compared to silicon (Si) or gallium arsenide (GaAs) die, including: higher breakdown voltage, higher saturated electron drift velocity, higher thermal conductivity, and higher efficiency. 


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Richardson RFPD to Sponsor EDI CON GaN Panel

Richardson RFPD Inc.has announced its Gold-level sponsorship of the Electronic Design Innovation Conference (EDI Con 2014) to be held at the Beijing International Convention Center, Beijing, China, April 8-10, 2014. As a gold sponsor, Richardson RFPD will organize a special expert forum discussing the state-of-the-art in Gallium Nitride (GaN) semiconductor technology targeting high-power RF and microwave applications. As the sponsor, Richardson RFPD has assembled a panel of experts from leading suppliers of discrete transistors and integrated circuits based on GaN technology.


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Richardson RFPD to exhibit at IMS 2012

Richardson RFPD Inc. announces its attendance and participation at the 2012 IEEE International Microwave Symposium (IMS). IMS, along with the RFIC symposium and the ARFTG conference, is part of Microwave Week, the largest gathering of radio frequency (RF) and microwave professionals, and the most important forum for the latest and most advanced research in these fields.


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