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The LTE technology as specified within 3GPP Release 8 was first commercially deployed by end 2009. Since then the number of operators implementing the technology is strongly increasing around the globe. LTE has become the fastest developing mobile system technology. The same way GSM and WCDMA have been enhanced with additional features over time, LTE is continuously worked on. Initial enhancements have been included in 3GPP Release 9 and are described in this white paper.
Multiple input multiple output (MIMO) technology is an integral part of 3GPP E-UTRA long term evolution (LTE). As part of MIMO, beamforming is also used in LTE. This application note provides a brief summary of the transmission modes (TM) in LTE and describes the beamforming measurements for base stations (BS) and user equipment (UE). The T&M options using various Rohde & Schwarz instruments are also presented.
TETRA, the TErrestrial Trunked RAdio, is the professional mobile radio standard (PMR) used world wide by governmental safety and security authorities and organizations, as well as by private utilities from energy suppliers through to transport. Rohde & Schwarz provide test instruments idealy suited for both the development and production of TETRA base stations and user equipment, as well as for network planning, network coverage and quality of service, network monitoring and optimization, maintenance, and service. This Application Note shows examples for measurements with R&S instruments covering the entire range of TETRA test requirements.
This White Paper provides a general overview of different military and commercial radar systems. It also touches some typical measurements challenges on such systems and their components.There is a complementary application note, a new version of the 1MA127 which provides information on radar test and measurement to the main target groups A&D and Automotive. Addtionally it provides an overview of core radar-related products from Rohde & Schwarz.
The measurement speed for spurious signal measurements is mainly defined by the spectrum analyzer sweep speed. With traditional swept spectrum analyzers and tight spurious limits the measurement can easily take hours or even a full day. This application note describes the differences in sweep speed between swept spectrum analyzers and modern spectrum analyzers with a wide-band FFT process, and how this improves the measurement speed for general spurious measurement.
This Application Note describes the differences in intermodulation distortion measurements between traditional spectrum analyzers with analog narrow-band IF signal path and modern spectrum analyzers using a wide-band IF signal path and digital RBW filters.
RF/microwave connectors are small and often overlooked, but they serve as gateways for many electronic devices and systems, linking components and systems together to enable proper operation. Coaxial connectors are often taken for granted—until they fail. They are instrumental to the operation of many electronic devices and systems, from cellular telephones and wireless data networks to the most advanced radar and electronic-warfare (EW) systems. Whether designing or simply maintaining electronic devices and systems, understanding the role of the RF/microwave connector can help to boost both performance and reliability.
Software-defined RF test system architectures have become increasingly popular over the past several decades. Almost every commercial off-the-shelf (COTS) automated RF test system today uses application software to communicate through a bus interface to the instrument. As RF applications become more complex, engineers are continuously challenged with the dilemma of increasing functionality without increasing test times, and ultimately test cost. While improvements in test measurement algorithms, bus speeds, and CPU speeds have reduced test times, further improvements are necessary to address the continued increase in the complexity of RF test applications.
Higher data rates introduce new challenges for test solutions. There are several 20+ Gbit/s high speed standards (Table 1) that are driving the upper end of the test spectrum to 70 GHz and even 110 GHz. Accurate measurements are needed to better understand higher order harmonics, as will new challenges related to conductor skin effects and dielectric losses on PC boards, along with the design trade-offs related to choices of vias, stackups, and connector pins.