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Generation of Radar Signals in a Hardware in the Loop (HIL) Environment

This application note belongs to a series of application notes which explain how to test EW receivers at RF in the lab with commercial, off-the-shelf signal generators and software. The series will cover all relevant use cases. This application note will discuss the generation of radar signals in a hardware in the loop (HIL) environment with PDW streaming.

Designing BUC/SSPAs for Airborne Applications

As we witness the evolution of integrated communication, we also observe the increased number of requirements for airborne microwave transmission, ranging from satellite to air-to-ground CDL band communications. Airborne applications introduce many challenging design constraints including increased temperature ranges, thermal management, vibration and shock, EMC/EMI, power requirements, and safety, all while maintaining portability as a key factor.

Reliable and Flexible Simulation of Angle of Arrival (AoA)

Engineers often need to test the direction finding capabilities of radar warning receivers in the lab. A perfect solution is to use multiple coupled R&S®SMW200A vector signal generators that are phase-coherent and time-synchronized. This setup enables simulation of the angle of arrival (AoA) of radar signals in the lab.

RF/Microwave Technology Driving the Connected Car

In-car networks and advanced driver-assist systems (ADAS) present many design challenges to engineers. This white paper looks at Cadence® AWR Design Environment® software solutions for RF to millimeter-wave (mmWave) front-end component development that address electronic product development for automotive applications.

The Cellular GaN Era Has Arrived

The articles in this eBook make the case for GaN for cellular applications. It begins with two views of the market trends and how these translate into forecasts, from Yole Développement and Strategy Analytics. Since efficiency is so important to power amplifiers, a foundational article by Rohde & Schwarz reviews the fundamental mechanisms that can improve PA efficiency: waveform engineering, supply modulation and load modulation. Illustrating waveform engineering, an article from researchers at Huazhong University of Science and Technology describe the design of a dual-band, continuous inverse class F PA. The following article examines the topology options for mMIMO PAs. Looking to the future, it concludes with an article describing development of a 28 GHz, ½ W linear, asymmetric Doherty PA MMIC.

Accelerating Integration in Automated Test Systems

Defining an automated test system can be challenging: the goal of a test system architect is to accelerate the test system design process, ensure that the system can be easily deployed and sustained throughout the product life cycle and, of course, all while maintaining test quality.

NewSpace Terminal Testing Challenges and Considerations

Today’s satellite communication systems combine features from legacy cellular networks and emerging wireless technologies. New constellations are under development that attempt to provide ubiquitous mobility and internet networks via satellites, ground stations and user terminals (Figure 1). Each link in the supply chain presents unique challenges for R&D, production and deployment for both the components and system development.

Flying an Agile RF Transceiver in Space

ADI’s unique commercial space flow enables satellite bus and payload builders to integrate a modern solution rapidly that meets the specific needs of the newest generation of on-orbit space vehicles. Aside from the process, we’ll explain the rationale behind having two commercial space flows on the impacts on RF and Microwave products.

Application Note: Improving R&S®FSWP Measurement Speed

For automated test applications, measurement time is often as important as the quality of the measurement. In practice, phase noise measurements are generally not considered fast, but test engineers still desire to save as much test time as possible. With this paper you get a modern, digital signal processing based, phase-noise test set that performs many tasks in parallel in an effort to improve measurement speed.

Time Domain Analysis with a VNA

A Vector Network Analyzer (VNA) natively measures complex S-parameters of a device under test (DUT) in the frequency domain mode by sweeping across various frequency points. While there is an exhaustive list of measurements that can be accomplished in the standard frequency domain mode – using the advanced inverse Chirp z-transformation, the measurements can also be simultaneously analyzed in the time domain mode. This gives the added advantage where the two fundamental modes of analysis can be performed by one single instrument.