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A full-wave 3D electromagnetic simulator can be used to simulate and visualize the propagation of electromagnetic fields across PCBs. This article will describe how CST MICROWAVE STUDIO® can be successfully used to characterize the response of high-speed channels, and how typical SI results and eye diagrams can be numerically calculated to predict the response of a channel.
CST STUDIO SUITE 2013 is the culmination of years of research
and development into finding the most accurate and efficient
computational solutions for electromagnetic (EM) designs. From
static to optical, and from the nanoscale to the electrically large,
CST STUDIO SUITE includes tools for the design, simulation and
optimization of a wide range of devices.
Doherty combiner product line covers major
communication bands ranging from 700 MHz to 2700 MHz. Each model is optimized for the center
frequency of targeted frequency band. However, as new spectrum is being released, the preâdesigned standard models can be tuned in customer applications to
meet performance.
This document provides guidelines to tune these standard models for offâband applications.
The purpose of this application note is to review a portion of the wireless technology and focus on a line of amplifiers that has been optimized for wireless test use. This analysis can also be applicable to some additional portion of wireless technology.
In this white paper
we look at the impact of calibration downtime during on-wafer testing and discuss
how recent advances enable longer time periods between calibrations.
This White Paper provides a general overview of different military and commercial radar systems. It also covers some typical measurements on such systems and their components.
This white paper presents the basic idea behind software defined radio (SDR) and provides an overview of the Rohde & Schwarz radios and further details of SDR test and measurement solutions offered by Rohde & Schwarz.
The scope of the subject has
expanded in the recent years in terms of
its technical evolution and spreading of
applications. This application note along
with its corresponding white paper
1MA207 show how to use the R&S radar
product portfolio to tackle test and
measurement tasks in modern radar
technology. Target groups are students
who want to become familiar with radar
issues as well as radar professionals who
want to solve certain test and
measurement tasks.
Higher data rates introduce new design challenges such as conductor skin effects and dielectric losses on PC boards, along with the design trade-offs related to choices of vias, stackups, and connector pins. Evaluating a selection of backplane materials and the impacts of various structural designs requires accurate measurement in both frequency and time domain.
