Lawrence P. Dunleavy, Thomas M. Weller, Paul G. Flikkema, Horace C. Gordon, Jr. and Rudolph E. Henning

A Versatile Test Bench for Wireless RF/Microwave Component Characterization Recent advances in instrumentation, motivated by the volume and cost demands of the commercial wireless marketplace, allow a powerful RF/microwave test bench to be assembled at relatively low cost. A versatile test bench comprising a vector network analyzer (VNA), spectrum...