NOFFZ Technologies GmbH, Toenisvorst, Germany

The HDS introduces a centralized data source/sink mechanism, streamlining testing processes for various high-speed interfaces such as Automotive Ethernet, Automotive SerDes, PCI Express (PCIe), Video, USB, and other differential signals up to 12Gbps.

The IoT Test Node is a simple, cost-effective, and functional test tool. It already offers entry-level RF functional testing for Internet of Things devices and automotive wireless connectivity modules.

The NOFFZ Base Station Emulator ensures that IoT cellular interfaces can be easily validated in the laboratory or tested end-of-line.

The system was developed as a production tester for wireless communication devices and is specially designed for high volume parallel testing.