Characterizing Uncertainty in S-Parameter Measurements October 10, 2019 Tekamul Buber, Pragti Narang, Giampiero Esposito and Sathya Padmanabhan, Maury Microwave, Ontario, Calif. and Markus Zeier, Federal Institute of Metrology (METAS), Berne-Wabern, Switzerland 0 Comments
