The addition to a new database sampling technique to the MMICAD linear simulator for modeling MMIC yields accurately
Database Sampling: A Real-world Solution to MMIC Yield Sensitivity Analysis Randall North and David Kennedy Optotek Ltd. Kanata, Ontario, Canada Mike Murphy M/A-COM, Microelectronics Division Lowell, MA In the course of a typical MMIC development and manufacturing program, there are a number of common issues that affect design success...
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