Technical Library/White Papers

RSS

Automatic Fixture Removal (AFR) is a simple and an accurate way to de-embed a measurement fixture. These fixtures are typically used when measuring Surface Mount Device (SMD) type components to provide an interface from the Vector Network Analyzer (VNA) test port cables to the Device Under Test (DUT). The main challenge when characterizing such components is to completely isolate the actual DUT characteristics from the fixture; which becomes even more challenging at higher frequencies.

In Part 1, we introduced the phased array concept, beam steering, and array gain. In Part 2, we presented the concept of grating lobes and beam squint. In this section, we begin with a discussion of antenna sidelobes and the effect of tapering across an array. Tapering is simply the manipulation of the amplitude contribution of an individual element to the overall antenna response.

Taking the R&S ESR EMI test receiver as an example, this paper looks at a CISPR 16-1-1- compliant test instrument with time domain scanning capabilities. The paper compares the measurement speed and level measurement accuracy of a conventional stepped frequency scan versus an advanced FFT-based time domain scan. It also contains guidance on making optimum use of time domain scans.

Phase-critical analog and digital transceiver systems are increasingly relied upon in global Aerospace & Defense programs, due, in part, to the rapid advancement and growth of high-resolution phased array antenna technology. These advancements are enabling significant innovation in satellite-based communications (SATCOM), surface, airborne, and space-based radars, secure point-topoint communications, autonomous vehicles, electronic warfare (EW), and space research.

Arbitrary waveform generators or AWG’s come close to being universal signals sources. They are digitally based devices capable of generating any waveform, within published limits of bandwidth, memory length, accuracy, and output level. Sixteen bits of amplitude resolution are available with bandwidths from 70 to 600 MHz and output levels as high as 24 Vpp.

In this paper we discuss a commonly asked question, “Why not just integrate a filter in the board stack?” Besides overall filter performance concerns, our answer to this comes in two parts: First there are manufacturing tolerances to consider, and second there is size.

The 5G test industry requires improved reliability of cable assemblies to help improve test outcomes. A significant portion of a test system’s stability and repeatability is determined by the precise performance of microwave/RF cable assemblies. Engineers should understand how cable assemblies affect the test system to maximize and optimize overall performance.

5G networks will need to offer more capacity and flexibility while lowering the operational expenses of the system. Two new technologies can simultaneously address both the increase in capacity and the increase in energy efficiency: Virtualization & Massive MIMO. The white paper provides an overview of test solutions addressing current and future requirements for antenna verification including both conducted and over-the-air (OTA) test methods, which result from applying Massive MIMO antenna technology.

This is the second article of our three-part series on phased array antenna patterns. In Part 1, we introduced the phased array steering concept and looked at the influencers on array gain. In Part 2, we’ll discuss grating lobes and beam squint. Grating lobes can be hard to visualize, so we’ll draw on their similarity with signal aliasing in digital converters, then use that to think of a grating lobe as a spatial alias.

While the world’s militaries increasingly rely upon seamless wireless communication networks for multi-domain battlefield readiness, protecting these mission critical networks from disruption and catastrophic failure becomes paramount.