RF & Microwave Industry News

Women Launch Into Space

With IMS 2013 less than one week away, I know everyone here at Microwave Journal is gearing up and ready to go. It is one show (aside from European Microwave Week and Electronic Design Innovation – EDI CON) where a majority of our staff attends the show and you can feel the excitement as we look forward to connecting with much of the industry all in one venue. The IEEE MTT-S IMS is the premier annual international meeting for technologists involved in all aspects of microwave theory and practice. It consists of a full week of events, including technical paper presentations, workshops, and tutorials, as well as a full set of social events. One of those social events is the Women in Microwaves (WIM) Reception.


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TI introduces industry's fastest 4-channel, 14-bit ADC at 250 MSPS

Texas Instruments Inc. (TI) introduced the industry’s fastest 4-channel, 14-bit analog-to-digital converter (ADC), clocking in at 250 MSPS. The high-density ADS4449 enables receiver systems to support up to 125 MHz of instantaneous bandwidth in extremely small forms, such as multiple input and multiple output (MIMO) base stations and munitions guidance, or in greater density applications, such as active electrically scanned array (AESA) and other phased-array radars.


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Nuhertz integrates Modelithics models into filter design software

Nuhertz Technologies has provided the capability to optimize synthesized filter circuits with the use of Modelithics® component models, along with Nuhertz filter design software. The Modelithics CLR Library available for AWR Corp.’s Microwave Office® provides the designer access to a huge library of proven-accuracy measurement- based highly scalable equivalent circuit models. 


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MiCOM Labs introduces MiTest, the first cloud based modular test system

MiCOM Labs Inc., has released MiTest, a hardware and cloud based computing test system that can accelerate product development release by running regulatory compliance testing in a company’s own design lab.  “MiTest provides manufacturers the ability to consolidate company-wide test processes, enabling flexible in-house compliance testing and certification possibilities for new products,” said Gordon Hurst, president and CEO for MiCOM Labs.


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AEM's tin whisker mitigation process assures surface-mount component reliability

AEM Inc. announces a hirel-qualified Sn/Pb (tin/lead) conversion process designed to mitigate the formation of tin whiskers in surface-mount components. The AEM process eliminates potential damage to sensitive electronic devices caused by conventional hot-solder dippingwhile ensuring that converted component terminations con­tain a minimum of 5 percent Pb as verified by SEM/EDS and XRF inspection methods.


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