RF & Microwave Industry News

Modelithics COMPLETE Library v10.1 of simulation models now available for AWR's Microwave Office

AWR Corp., the innovation leader in high-frequency EDA software and Modelithics Inc., the industry leader in simulation models for RF, microwave, and millimeter-wave devices, announce the availability of Version 10.1 of the Modelithics COMPLETE Library of passive and active device models for AWR’s Microwave Office® high-frequency design software.


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San-tron "Rocks Seattle" – displays several coaxial innovations at IMS 2013

San-tron Inc., (www.santron.com), a leading manufacturer of RF and microwave coaxial connectors and cable assemblies, is pleased to announce that they’ll be displaying a variety of innovative RF/Microwave coaxial connectors and cable assemblies in booth #520 at the 2013 International Microwave Symposium June 4-6th at the Seattle Convention Center. With a rockin’ theme, including a giveaway of one of the hottest tech toys―a Jawbone Jambox portable bluetooth hi-fi system―San-tron will be reviewing some of their most revolutionary coaxial designs.


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MIL-STD is standard in KCB booth at IMS 2013

KCB Solutions is pleased to announce a suite of MIL-STD certified products and services for the military, aerospace, and defense market. They’ll be exhibiting in booth #1610 at the International Microwave Symposium in Seattle, WA June 4-6th. Senior staff will be on-hand to answer questions about KCB’s leading edge semiconductor packaging services, manufacturing services and recently launched standardized and fully-screened components.


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Anritsu to showcase test solutions that address high-frequency designs at IMS 2013

Anritsu Co. (booth #938) will display test solutions to meet the high-frequency testing requirements of engineers in the aerospace and defense, communications, and semiconductor industries at IMS 2013 in Seattle, June 4-6. Featured will be the VectorStar Vector Network Analyzer (VNA) platform, which is an ideal solution for device characterization, as well as solutions for measuring components and subsystems used in radar, high-speed serial, microwave backhaul, wireless network, and other applications.  


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