White Papers

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Time Domain Analysis with a VNA

A Vector Network Analyzer (VNA) natively measures complex S-parameters of a device under test (DUT) in the frequency domain mode by sweeping across various frequency points. While there is an exhaustive list of measurements that can be accomplished in the standard frequency domain mode – using the advanced inverse Chirp z-transformation, the measurements can also be simultaneously analyzed in the time domain mode. This gives the added advantage where the two fundamental modes of analysis can be performed by one single instrument.


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Analog Devices Advances RF/mW in The Space Industry

On Saturday, May 30th, people across the world watched in awe as SpaceX launched a rocket, designed independently of any government, putting two astronauts into orbit on their way to the International Space Station — the first time in history for any commercial company. Ten years ago, this would have been an unthinkable endeavor for any commercial or private organization.


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5G Evolution – on the Path to 6G

5G is now - what´s next?

5G deployments have only recently started, and releases beyond R15 will continue to tap into the tremendous potential of 5G. However, as a new generation of cellular technology typically appears every 8-10 years, 6G can be expected around 2030.

Download this white paper to explore the evolution from 5G to 6G from a service, air interface and network perspective.


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Time Domain Analysis with Copper Mountain Technologies Vector Network Analyzers (VNA)

In many applications it is necessary to make multiport measurements. The RNVNA links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port. In other words, S11, S22, S33 and so on will be complex measurements and S21, S31, S41 and so on will be scalar only measurements.


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Jitter Analysis with the R&S®RTO Digital Oscilloscope

This application note introduces the Jitter analysis capabilities of the R&S® RTO Digital Oscilloscope and the Jitter option R&S®RTO-K12 for digital signals. It provides background information on jitter sources and standard jitter measurement tools. Furthermore it demonstrates Period jitter, Cycle jitter and Time Interval Error jitter measurements based on an application example. The benefits of different representations of the measurement results with histogram, track and spectrum display are discussed.


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ATE Strategy For mmWave Mass Market Production

The automated test and measurement (ATE) landscape is rapidly changing, progressing beyond the capabilities of traditional bench-top and most legacy ATE systems. Varying and diverse performance requirements, testing speeds and frequencies used by modern cellular architectures (5G), Internet-of-Things (IoT) devices, and the latest feature dense systems-on-chip/systems-inpackage (SoC/SiP) necessitate a different approach.


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The Rebirth of HF

HF stands for “high frequency” and is usually used to refer to signals with frequencies in the range of 3 MHz to 30 MHz, although in many cases the practical definition of HF has be extended down to frequencies as low as 1.5 MHz.


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