Articles Tagged with ''test''

Pasternack now offers family of ready-to-use semi-rigid test probes up to 6 GHz

Pasternack, a leading provider of RF, microwave and millimeter wave products, debuts a new line of semi-rigid test probes designed to assist in testing microwave circuits. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, sampling measurements with these probes can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate.


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Keysight introduces industries’ highest performance Gen 3 PXIe chassis and system components

Keysight Technologies Inc. announced a Gen 3 PXIe chassis and set of Gen 3 system components designed for complex, high-performance applications. Doubling the system bandwidth, the new products improve data streaming for capture/playback applications, such as 5G and electronic warfare. The Gen 3 products also provide a superior platform for large multi-channel and multi-chassis PXIe test systems for applications, such as MIMO and PA/FEM.


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