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Anritsu has introduced a vector network analyzer (VNA) capable of measuring from 70 kHz to 220 GHz in a single sweep. With single sweep capability, the 220 GHz ME7838G avoids the need to reconstruct the wafer probe station above 110 GHz to conform to the higher frequency waveguide bands.
MPI Corporation has installed the THZ probe system at the Kollberg Laboratory at Chalmers University to develop measurement solutions for wafer-level characterization at THz frequency range.
Rohde & Schwarz has launched the R&S ZNLE vector network analyzer to address the requirements of customers looking to perform RF measurements to characterize components such as antennas, attenuators, filters and PCBs.
Bluetest is introducing a 5G extension package to the RTS65 reverberation chamber that enables MIMO OTA measurements for initial trials and deployments of 5G applications.
Rohde & Schwarz has introduced the R&S RT-ZPR20, extremely low-noise power rail probe with a bandwidth of 2 GHz. Its 1:1 attenuation also ensures very good sensitivity. The large offset range of ± 60 V permits analysis of the smallest disturbance signals during power integrity measurements, even on DC power supplies with a high voltage level. The probe also features an integrated high-precision DC voltmeter. The quality of the power supply is a key factor in the functionality and performance of sensitive electronic circuits.
Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.
Developers of wireless products that need to push to the higher communication bands now have access to an affordable VNA for operation up to 6 GHz. The new MegiQ VNA-0460 VNA measures impedances and other S-parameters from 400 MHz up to 6 GHz.
Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.
Developers of wireless products that need to push to the higher communication bands now have access to an affordable VNA for operation up to 6 GHz. The new MegiQ VNA-0460 VNA measures impedances and other S-parameters from 400 MHz up to 6 GHz.