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Anritsu Corporation announced that a one-box tester supports both RF and protocol conformance testing for 5G communication devices by enhancing the functionality of its New Radio RF Conformance Test System ME7873NR Lite Model.
RanLOS AB recently secured a major deal with its distributor TOYO Corporation in which the RanLOS sub-6 GHz test system will be demonstrated to an international conglomerate as well as leading automotive manufacturers seeking for innovative connectivity test solutions in Asia.
Rohde & Schwarz and NOFFZ Technologies collaborate on the integration of the R&S Compact Antenna Test Range (CATR) reflector technology and advanced radar echo generator R&S AREG800A into NOFFZ’s UTP 5069 CATR.
Keysight announced the new Keysight P9002A parallel parametric test system, which provides high throughput and cost-effective wafer test to accelerate time-to-market in R&D and lower cost-of-test in manufacturing.
