We use cookies to provide you with a better experience. By continuing to browse the site you are agreeing to our use of cookies in accordance with our Privacy Policy.
Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with industry-leading engineering probe systems from FormFactor.
Rohde & Schwarz launched the R&S ZNA, the industry’s first purely touch-operated vector network analyzer, originally two years ago. The newly introduced models cover frequency ranges of up to 50 GHz and 67 GHz.