Home » Topics » Featured White Papers » Files

Featured White Papers

Multi-Tone Testing Theory & Practice

December 14, 2022

Multi-tone testing has many benefits. While the multi-tone method was initially implemented to increase the speed of IEC 61000-4-3 radiated immunity testing, it has been found that this method also improves equipment efficiency, offers greater flexibility to truly test the equipment (EUT) under real-world threat conditions, and can be fully compliant to standards.

Fundamentals of THz technology for 6G

December 14, 2022

The prospect of offering large contiguous frequency bands to meet the demand for extremely high data transfer rates in the Tbit/s range is making terahertz (THz) waves a key research area for the next generation of wireless communications (6G). This white paper offers an overview of the fundamentals of THz waves and their properties for various applications with a focus on 6G based communications.

In-Design Thermal Analysis for MMIC and RF PCB Power Applications

December 14, 2022

Next-generation electronic systems often demand increased RF power within a smaller footprint to meet demanding performance and size requirements. This paper discusses the impact of operating temperature on RF device performance and presents a thermal analysis solution in which the Cadence Celsius Thermal Solver is integrated with the AWR Design Environment RF/microwave platform.

Using a Higher-Order Basis Function based Method of Moments Analysis for Designing Compact Antenna Test Ranges

December 14, 2022

Full-wave electromagnetic simulation of a Compact Antenna Test Range (CATR) is not trivial given its electrical size. Typically, the reflector geometry is simulated using asymptotic methods using an assumed feed pattern, while RF absorber and its effects are ignored.

How Cellular-V2X (C-V2X) Makes Driving Safer and More Efficient

December 14, 2022

Download this poster to get a comprehensive overview of applications enabled by C-V2X; including example scenarios, an explanation of the different types of communications such as Uu and PC5 and a list of regional standards bodies.

Additive White Gaussian Noise – What Is It & How Can It Integrate into Today’s Advanced Systems?

December 13, 2022

Noise is an ever-present factor that affects the performance of wireless systems. In its broadest sense, noise represents undesired electromagnetic (EM) disturbances that can distort information-carrying EM signals. These distortions can originate from internal sources that are generated within electronic systems, as well as natural or man-made external sources, such as atmospheric noise, cosmic noise, and EM interference.

5G NTN Takes Flight: Technical Overview of 5G Non-Terrestrial Networks

November 14, 2022

This white paper aims to provide you with a thorough overview of the major aspects of 5G non-terrestrial networks technology and corresponding challenges. We haveincorporated the latest state of the technology involved, representing the current status of the standardization work ongoing in 3GPP.

Supercharging your VNA with an RF Matrix Switch (VNA Port Extension)

November 14, 2022

One challenge facing test engineers charged to evaluating today’s complicated wireless networks & devices is the sheer number of potential RF connections requiring scrutiny. Readers will learn how RF switch matrices can extend the port count of VNAs to meet the testing demands of modern wireless standards & sensing technologies.

Ready for Launch: Understanding the Nuances of Space-level Qualification and Screening of Filters

November 14, 2022

For every mission-critical application, the space qualification and screening process is unique. Download our new white paper to learn more about the common standards and testing processes that will help ensure components are designed to operate reliably in challenging space environments.

Near and Far-Field Antenna Measurement

November 14, 2022

A vector network analyzer is an essential tool for the characterization of antennas. This application note provides an overview of near and far-field measurement techniques. There are challenges to either method, and a solid understanding of these will be helpful to achieve superior measurement results.