Pat Hindle, MWJ Editor
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Pat Hindle is responsible for editorial content, article review and special industry reporting for Microwave Journal magazine and its web site in addition to social media and special digital projects. Prior to joining the Journal, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.

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IEEE EMC 2008 - Detroit, MI

August 19, 2008

Patrick Hindle

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I am here at the IEEE EMC 2008 Symposium in Detroit, MI and the attendance seems relatively light but the quality of attendees very good. Three companies are anchoring the exhibition as you enter; AR, ETS Lingren and Rohde & Schwarz. From a RF/microwave perspective, AR is featuring its high power amplifiers such as its 700 W .8 to 4.2 GHz CW, 120 W 4 to 8 GHz CW and 20 W 10 to 20 GHz CW units. ETS Lingren and R & S are actually overlapping their booths showing how they can combine their hardware and software to create complete system solutions for various industries such as automotive EMC solutions. ETS Lingren also is featuring their wide range of antennas and R & S is showing off their ESL EMI test receiver for cost conscious users who want to perform precise precompliance and diagnostic measurements up to 3 or 6 GHz.

The technical program is very strong with various workshops and a wide range of technical conference subjects including design, modeling/simulation, measurement/test, shielding and product safety. Next year the event will be in Austin, TX and hopes to expand more each year.