Pat Hindle, MWJ Editor
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Pat Hindle is responsible for editorial content, article review and special industry reporting for Microwave Journal magazine and its web site in addition to social media and special digital projects. Prior to joining the Journal, Mr. Hindle held various technical and marketing positions throughout New England, including Marketing Communications Manager at M/A-COM (Tyco Electronics), Product/QA Manager at Alpha Industries (Skyworks), Program Manager at Raytheon and Project Manager/Quality Engineer at MIT. Mr. Hindle graduated from Northeastern University - Graduate School of Business Administration and holds a BS degree from Cornell University in Materials Science Engineering.

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Keithley Sells RF Product Line to Agilent

November 25, 2009

Patrick Hindle

1 Comment

Big news yesterday in the RF test and measurement world as Agilent agreed to purchase all of Keithley's RF test product line. It appears that these products were not profitable for Keithley in the short-term so they were turned into cash as they expect to receive proceeds of approximately $9 M and to realize a pre-tax gain in the range of $2.5 to $3.5 M during its first quarter (ending this year) as a result of the sale. It also seems that all workers at the Santa Rosa design center have been offered jobs with Agilent’s Santa Rosa-based Electronic Measurement Group as the Keithley location on Aviation Boulevard will become an Agilent facility next month which is good news for the employees. The official news item is linked above.