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The Tek Talk blog features contributions from a collection of RF and microwave test and measurement experts at Tektronix. The focus is on providing tips and strategies to help RF designers and engineers perform measurements more effectively, whether they are engaged in WLAN, radar and electronic warfare, EMI conformance testing or spectrum management.

High Power Semiconductor Load-pull Testing

February 3, 2012
One particularly tough RF test challenge is the load-pull characterization of high power devices, such as those used in mobile base-stations. Characterization of these devices at the actual operating power of the final system brings with it a number of challenges. Here we cover an active load pull solution.
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Visualizing Resolution Bandwidth Filters - Hit the Gas

January 23, 2012
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To kick things off I thought I'd talk about visualizing resolution bandwidth filters. I recently came across a good analogy, from a colleague Alan Wolke, to describe the concept of resolution bandwidth, and why it takes so long to get discriminated signals close together.


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