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Measurement of On-wafer Transistor Noise Parameters Without a Tuner Using Unrestricted Noise Sources

Presentation of a method for calibrating the four noise parameters of a noise receiver that does not require a tuner
Technical Feature Measurement of On-wafer Transistor Noise Parameters Without a Tuner Using Unrestricted Noise Sources This article presents a method for calibrating the four noise parameters of a noise receiver which does not require a tuner. The method permits using general (mismatched) noise sources, which may present very different...
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