A recently developed pulsed-measurement instrument that measures the RF large-signal and DC characteristics of discrete GaAs FETs , high electron mobility transistors and integrated devices in GaAs MMICs
A Pulsed-measurement Instrument for Device Testing GaAs Code Ltd. Linton, Cambridge, UK For many discrete GaAs FETs, high electron mobility transistors (HEMT) and integrated devices in GaAs MMICs, the large-signal IV characteristics of the device at RF, microwave or mm-wave frequencies are very different from the DC characteristics. This...
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