Charles Baylis, Lawrence Dunleavy and William Clausen

Articles by Charles Baylis, Lawrence Dunleavy and William Clausen

The Importance of Sweep Rate in DC IV Measurements

The importance of taking due care in setting up IV measurement sweep rate is explored for the case of a GaAs MESFET and a silicon MOSFET. A numerical metric, called the normalized difference unit (NDU), is shown to be useful in determining appropriate ...

March 7, 2005

Charles Baylis, Lawrence Dunleavy and William Clausen

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The DC IV characterization of a device is important in predicting RF operation. DC IV results predict the quiescent bias and low frequency IV characteristics for a device, while in some cases they can be corrected to represent RF characteristics at a given quiescent bias point. 1,2 In addition,...