Frank-Werner Thümmler and Thilo Bednorz, Rohde & Schwarz

Measuring Performance in Pulsed Signal Devices: A Multi-faceted Challenge

This article describes several approaches for generating modulated pulsed signals with signal generators and analyzing devices stimulated with these kinds of signals using vector network analyzers. In particular, it focuses on when an analog signal gen...

September 18, 2007

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Measurements with pulsed stimulus signals are undertaken for a number of reasons. For instance, in a wide range of applications, devices under test (DUT) must be characterized by using pulsed signals instead of CW signals. Here, the DUT is stimulated either with a pulsed RF signal or the device...

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