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M/A-COM Showcases Active Splitters for Multi-tuner Subscriber Hardware at ANGA Cable 2011

April 29, 2011

M/A-COM Showcases Active Splitters For Multi-tuner Subscriber Hardware

April 29, 2011

M/A-COM Technology Solutions will showcase its extensive line of active splitters for multi-tuner broadband voice, video and data customer premises equipment during the ANGA Cable show May 3 and 4. These active splitters, on display in the company's stand (#N51), offer a range of features and benefits, including: •2-,...

Agilent Opens Seventh Calibration Center in Americas

April 28, 2011

Agilent

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Agilent Technologies Inc. announced the opening of a new calibration center in Sunrise, FL. Now owners of Agilent electronic measurement instruments in that area can receive true local OEM calibrations, such as actual measurements performed using OEM procedures for every data-sheet specification, each time they use the center. “We’ve...

Rohde and Schwarz Presented With 2011 Support Solutions Supplier of the Year Award

April 26, 2011

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A Recap of the Panel Discussion on X-parameters and Measurement-Based Behavioral Models at the 2010 Compound Semiconductor IC Symposium

April 26, 2011

Michael Heimlich, Macquarie University and Joseph Gering, RFMD

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A Recap of the Panel Discussion on Measurement-Based Behavioral Models at the 2010 CSIC Symposium

The upcoming Nonlinear Characterization Expert Forum at this year's MTT-S IMS MicroApps will be moderated by Joe Gering of RFMD. Read Joe's recap of a similar panel discussion which took place last year at the Compound Semiconductor IC symposium featuring David Root (Agilent Technologies), Paul Tasker (Cardiff University), Mike Golio (Golio Consulting), Yusuke Tajima (Auriga Microwave), Gayle Collins (Freescale Semiconductor), and Ed Anthony (Skyworks Solutions).
CSICS2010 Nonlinear Panel Recap

The Nonlinear Characterization Expert Panel at MTT-S IMS MicroApps (Organized by Microwave Journal and the IMS MicroApps Steering Commitee)
Live: Baltimore - June 8, 12:00 to 1:30 pm
Details and registration for FREE webcast

National Instruments Introduces High Performance PXI Digitizers

April 25, 2011

National Instruments, Austin, Texas

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National Instruments released a high bandwidth PXI digitizer, complementing the rapidly expanding suite of performance instrumentation available in PXI. Co-developed with Tektronix , the NI PXIe-5186 digitizer employs Tektronix, Enabling Technology to achieve up to 5 GHz bandwidth and 12.5 GS/s sample rates. The company also announced the NI...

Skyworks Releases Positive Annual Sustainability Report

April 20, 2011

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Anritsu Introduced Software that Enables Testing of High Speed HSPA+ Wireless Devices

April 20, 2011

Anritsu Co.

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Anritsu Co. introduces a software option for its MD8480C W-CDMA/GSM Signaling Tester that enables testing for the latest W-CDMA/GSM devices supporting simultaneous 64QAM and MIMO. This release builds on existing W-CDMA/HSPA support in the MD8480C, ranging from Release 99 to Release 8, as well as previous introductions of the...