RF & Microwave Industry News

Noise XT introduces SLC ultra-low jitter/dual clock synthesizer

Test & Measurement

Noise eXtended Technologies (Noise XT) has introduced the 2 MHz to 7 GHz SLC ultra-low jitter/dual clock synthesizer. The SLC is an affordable single or dual clock USB synthesizer with outstanding jitter in a small package. With a noise floor of -170 dBc/Hz at 10 MHz, the SLC has the lowest phase noise of any synthesizer in a compact, low cost package. The SLC measures just 85 x 110 x 200 mm.


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Visit Agilent at IEEE MTT-S International Microwave Symposium 2014

Focus on the latest developments in microwave technology at the IEEE MTT-S International Microwave Symposium 2014 in Tampa, Florida, June 1-6. Join the world's largest gathering of RF/uW professionals in workshops, short courses, paper presentations, and panel sessions. Stop by Booth 1133 to discover the difference Agilent solutions can make in helping you achieve breakthrough results.


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P3 Communications eliminates RF interference in LTE/4G mobile networks

P3 Communications, a worldwide technical engineering, testing and consulting services company for the telecommunications industry, has selected the R&S PR100 portable receiver from Rohde & Schwarz as their instrument of choice for identifying and eliminating RF interference in 3G and 4G/LTE mobile networks. With units deployed across key mobile markets in the U.S., P3 Communications’ mobile network maintenance and engineering team is able to quickly and effectively identify RF interference negatively impacting customer quality of experience (QoE).


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Lake Shore IMS exhibit to feature high-frequency probing and characterization technology

Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announces that it will be exhibiting at the June 3–5 IEEE MTT International Microwave Symposium (IMS) in Tampa Bay, Fla., where it will discuss platforms that enable the study of devices and materials using high-frequency measurements.


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