Articles Tagged with ''measurement''

NI announces industry’s highest precision PXI source measure unit

NI announced the NI PXIe-4135 source measure unit (SMU) with a measurement sensitivity of 10 fA and voltage output up to 200 V. Engineers can use the NI PXIe-4135 SMU to measure low-current signals and take advantage of the high channel density, fast test throughput and flexibility of NI PXI SMUs for applications such as wafer-level parametric test, materials research and characterization of low-current sensors and ICs.


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Anritsu introduces cost-efficient, high-performance signal analyzers

Anritsu Co. expands its Signal Analyzer MS2840A family with the introduction of three models that support the 9 kHz to 3.6 GHz, 6 GHz, and 26.5 GHz frequencies. With the new instruments, Anritsu fills a market void for cost-efficient, high-performance signal analyzers that address the middle frequency ranges, providing an economical solution to accurately measure wireless equipment, oscillators and other components for narrowband applications, land mobile radio, wireless backhaul, radar and automobile electronics.


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MPI Corp. announces industry acceptance of TS150-THZ Probe System

As a result of numerous orders corresponding with the growth of terahertz frequency range measurements in the wafer test market, MPI Corp. has received industry wide acceptance of the TS150-THZ probe station as the standard for these complicated high frequency measurements. The TS150-THZ addresses the challenging test requirements of multiple emerging markets and applications, such as automotive radar, non-invasive imaging, defense, security and surveillance as well as short-range radar and high-speed 5G communication.


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