Articles Tagged with ''probe''

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Seica Full Probe Card Test

Thanks to many years of experience in testing probe cards, Seica has designed the PilotV8XL HR Next> series, which is the only flying probe that can offer a full turnkey solution for the Probe Card test.
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R&S RT-ZPR20

Rohde & Schwarz Introduces 2 GHz Bandwidth Probe

2 GHz Bandwidth Probe: RT-ZPR20

Rohde & Schwarz has introduced the R&S RT-ZPR20, extremely low-noise power rail probe with a bandwidth of 2 GHz. Its 1:1 attenuation also ensures very good sensitivity. The large offset range of ± 60 V permits analysis of the smallest disturbance signals during power integrity measurements, even on DC power supplies with a high voltage level. The probe also features an integrated high-precision DC voltmeter. The quality of the power supply is a key factor in the functionality and performance of sensitive electronic circuits.


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New Probe for Rohde & Schwarz Oscilloscopes Measures Voltages in the Millivolt Range

The new R&S RT-ZP1X passive 1:1 probe from Rohde & Schwarz broadens the application range of its R&S RTO and R&S RTE series oscilloscopes. Both the probe and the oscilloscopes' front-end are extremely low noise, making this combination ideal for measuring the smallest of signals down to 1 mV/div, e.g., for power integrity measurements on integrated circuits and components.


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Terahertz-frequency on-wafer probing option for Lake Shore cryogenic probe stations

Lake Shore Cryotronics is now offering for pre-order a unique terahertz-frequency probe arm option for their CPX, CPX-VF, CRX-4K and CRX-VF cryogenic probe stations. This arm enables precise probing and measurement of millimeter-wave devices at 75 to 110 GHz (WR10 band) or 140 to 220 GHz (WR5.1 band) frequencies within a tightly controlled cryogenic test environment.


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MPI Corp. announces industry acceptance of TS150-THZ Probe System

As a result of numerous orders corresponding with the growth of terahertz frequency range measurements in the wafer test market, MPI Corp. has received industry wide acceptance of the TS150-THZ probe station as the standard for these complicated high frequency measurements. The TS150-THZ addresses the challenging test requirements of multiple emerging markets and applications, such as automotive radar, non-invasive imaging, defense, security and surveillance as well as short-range radar and high-speed 5G communication.


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