Articles Tagged with ''analysis''

Agilent to demo new test solutions at CTIA

Agilent Technologies Inc. will demonstrate its high-performance test and measurement solutions at the CTIA Wireless show, May 8-10, at the Ernest N. Morial Convention Center (Booth 3935) in New Orleans. The company’s new solutions provide greater insight into devices being designed and tested, accelerating the development of the latest wireless technologies, including LTE, LTE-Advanced, GNSS, DC-HSDPA, 802.11ac WLAN and femtocells.


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Anritsu Co. enhances signal analyzers

Anritsu Co. introduces options for its MS269xA series that enhance the wideband FFT analysis of the signal analyzers. By expanding the measurement capability of the MS269xA series with the hardware options, Anritsu strengthens its position as a world leader in test solutions for microwave and next-generation mobile networks by providing a highly accurate analysis tool that can capture wideband signals used in satellite and radar systems, as well as in LTE Advanced designs.


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