Articles Tagged with ''instruments''

Agilent Technologies Inc. announced the Agilent U8480 Series, the world’s fastest USB thermocouple power sensors. Based on the same front-end design as the Agilent 8480 and N8480 Series power sensors, the new U8480 Series offers improved specifications, including a measurement speed of 400 readings per second, 10 times faster than the legacy series.

Agilent Technologies Inc. announced the opening of a new calibration and repair service center for electronic test instruments in Hanoi, Vietnam. The new Agilent Advantage Services facility will offer local calibration and repair services, adding to more than 50 service locations around the world.

octoScope Inc. announced a logic implementation of its MIMO octoFade™ wireless testing solution. When applied to a wireless signal using digital signal processing, channel emulation makes the signal appear as though it has traversed a realistic space, having been reflected from walls, cars, people or other surfaces.

National Instruments introduced test solutions for 802.11ac WLAN and Bluetooth low-energy technology that combine NI graphical system design software and modular, FPGA-based PXI instrumentation to provide high-performance test capabilities that are completely user-programmable. These test solutions along with other cellular, navigation and wireless connectivity solutions from NI, help engineers thoroughly test their devices on a single high-performance platform.

AWR Corp., the leader in high-frequency EDA, has added nine videos of its MicroApps presentations from the International Microwave Symposium (IMS) 2012 to its AWR.TV portal. Tune into the IMS channel to view the following AWR MicroApps presentations:

National Instruments introduced NI LabVIEW 2012, the latest version of its system design software. Users gain ready-to-run starting points for a breadth of LabVIEW applications and access to new training options that help improve the quality of their systems.

National Instruments introduced the world’s first RF vector signal transceiver (VST), the NI PXIe-5644R, and with it, a new class of software-designed instrumentation. This software-centric architecture represents a new era in which engineers and scientists can use LabVIEW to tailor open, field-programmable gate array (FPGA)-based hardware for their specific needs.

AWR Corp. <http://www.awrcorp.com/>, the innovation leader in high-frequency EDA, will exhibit within the RF and Wireless Pavilion on August 7-8 during NIWeek 2012 <http://www.ni.com/niweek/conference.htm>, being held in Austin, Texas.

National Instruments announced the promotion of Jin Bains to vice president of research and development of RF products. With nearly 20 years of expertise, Bains has consistently demonstrated outstanding global leadership in RF technology product innovation at NI. 

National Instruments (NI) released its 2012 Automated Test Outlook, which shares findings of the company’s research into the latest test and measurement technologies and methodologies.