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Agilent Technologies Inc. announced the 34450A 5½ digit Benchtop Digital Multimeter, designed to turbocharge electronic test and measurement applications for industrial and educational use.
CEA-Leti and Agilent Technologies will present their recent research results in the field of embedded integrated systems at the IEEE Silicon Monolithic Integrated Circuits in RF Systems (SiRF) Conference in Austin, TX, Jan. 21-23.
Agilent Technologies Inc. announced it will demonstrate its high-speed digital design and test solutions at DesignCon, Jan. 28- 31, at the Santa Clara Convention Center (Booth 201).
Agilent Technologies Inc. announced the opening of a new calibration and repair service center for electronic test instruments in Hanoi, Vietnam. The new Agilent Advantage Services facility will offer local calibration and repair services, adding to more than 50 service locations around the world.
Agilent introduced the industry's first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions. The offerings complement Agilent's other industry-first solutions for the LTE-Advanced standard.
With IC-CAP 2013.01, Agilent introduces major improvements to its flagship product for high-frequency device modeling. One key improvement is turnkey extraction of the Angelov-GaN model, the industry standard compact device model for GaN semiconductor devices.
Agilent Technologies Inc. has announced its annual Wireless Symposium focused on design, conformance and manufacturing, which will tour the UK in January 2013.
Agilent Technologies Inc. announced the new webcast, “Calibration Traceability and Standards Compliance,” hosted by Bob Stern, senior metrologist and Agilent Electronic Measurement Group representative to NCSLI.
Agilent introduced the industry's first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions. The offerings complement Agilent's other industry-first solutions for the LTE-Advanced standard.
With IC-CAP 2013.01, Agilent introduces major improvements to its flagship product for high-frequency device modeling. One key improvement is turnkey extraction of the Angelov-GaN model, the industry standard compact device model for GaN semiconductor devices.
Agilent Technologies Inc. (NYSE: A) announced shipment of Advanced Design System 2012, its flagship RF and microwave EDA software platform.