Articles Tagged with ''agilent''

Agilent extends high-performance noise-figure measurement technique to 50 GHz

Agilent Technologies Inc. announced the extension of its source-corrected noise-figure measurement capability in PNA-X network analyzers to 43.5 and 50 GHz, while continuing to maintain the highest noise-figure measurement accuracy in the industry. Built directly into the Agilent PNA-X, the technique provides a complete single-connection, multiple-measurement capability for R&D and manufacturing engineers developing and testing low-noise transistors, amplifiers, frequency converters and transmit/receive modules.


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Agilent opens PicoCafé, an online forum for atomic force microscope users

Agilent Technologies Inc. announced the launch of its online Pico Café, an interactive web community created exclusively for atomic force microscope users. Agilent AFM users from around the world are invited to visit the new PicoCafé at www.agilent.com/find/picocafe to share original script programming and instrumentation-related insights with one another.


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