Articles Tagged with ''agilent''

Agilent Technologies Inc. announced that Nitronex, a GaAs labs company and leading producer of GaN-on-silicon RF power devices, has selected Agilent to provide a complete GaN design flow that spans both device modeling and circuit simulation. The flow uses Agilent EEsof EDA’s IC-CAP model extraction software and Advanced Design System (ADS) circuit and system simulator—both market-leading platforms in RF and microwave design.

Agilent Technologies Inc. announced theE5063A ENA Series network analyzer, a low-cost ENA solution for manufacturing test. The instrument offers optimized performance and functionality for testing simple RF passive components, such as handset/BTS antennas, RF cables and filters. It can also be used in R&D for evaluation of RF passive devices and dielectric materials.

Agilent announced the newest version of its Command Expert software for faster and easier instrument control in many test application development environments.

Modelithics Inc. welcomed Syfer to the Modelithics Vendor Partner (MVP) Program. Syfer and Modelithics have collaborated to develop a Microwave Global Model™ for Syfer’s 0603 case-size High Q Ultra-Low ESR capacitor family. These simulation models are substrate scalable, part-value scalable, pad scalable, and orientation selectable (vertical or horizontal surface-mount).

Agilent Technologies Inc. introduced the Agilent N1055A 35/50-GHz (8-ps) time-domain reflectometry and transmission module for the Agilent 86100D DCA-X platform. The module provides fast, accurate impedance and S-parameter measurements on high-speed designs that have up to 16 ports.

Agilent Technologies Inc. introduced Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Agilent Technologies announced the recent installation of an Agilent 5600LS atomic force microscope with scanning microwave microscopy at the Cambridge Graphene Centre (CGC), in the UK.

Agilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.

UBM Tech, the daily source of essential business and technical information for decision makers in the electronics industry, will welcome thousands of influential members of the chip, package and board design communities to DesignCon 2014, January 28 – 31, at the Santa Clara Convention Center in Santa Clara, California. Recognized as the premier annual trade event and technical conference dedicated to the pervasive nature of signal integrity at all levels of electronic design, DesignCon will host Keynote Speakers from Intel, Micron Technologies and XPRIZE.  

Modelithics Inc. has teamed with Mini-Circuits to develop high-accuracy simulation models of Mini-Circuits’ 3.2 x 1.6 mm case-size surface-mount LFCN Low-pass filters and HFCN High-pass filters. The substrate-scalable models are validated up to 13 GHz, depending on the frequency band specifications of each filter.