Articles Tagged with ''characterization''

Keysight Technologies Inc. announced the newest release of its industry-leading device modeling and characterization software suite: Integrated Circuits Characterization and Analysis Program (IC-CAP) 2016, Model Builder Program (MBP) 2016, and Model Quality Assurance (MQA) 2016. The software release provides designers characterizing and modeling semiconductor devices with further advances in modeling and characterization efficiency.

AMCAD Engineering will be showcasing their latest solutions at the upcoming EuMW conference on September 8-10 in Paris, France.Visit booth (#A204) to discover what's new from AMCAD, meet their RF/microwave experts and see live demonstrations.

Focus Microwaves announced it has expanded its base of high-frequency measurement and modeling technologies through the acquisition of Cardiff, UK-based Mesuro, a leader in the development of RF/microwave and high-speed-digital device modeling, characterization and optimization solutions.

 Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announced that it will be exhibiting solutions for high-frequency material characterization at the 39th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Sept. 14–19, in Tucson, Ariz. 

 Agilent Technologies Inc. announced several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite comprises Agilent EEsof EDA’s Integrated Circuits Characterization and Analysis Program (IC-CAP), Model Builder Program (MBP), and Model Quality Assurance (MQA). 

Anritsu Co. introduces the VectorStar™ ME7838E vector network analyzer (VNA) broadband system that provides frequency coverage from 70 kHz to 110 GHz in a single connection. Incorporating all the benefits of the VectorStar ME7838 series broadband system, the ME7838E addresses the challenges associated with today's high-speed device characterization.

Averna announces a new software release for RF Studio, featuring the ability to synchronize four channels within 1 ns, among other enhancements.

Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, announced that it will be discussing its soon-to-released terahertz (THz) system for materials characterization at the upcoming American Physical Society March Meeting in Denver.

Agilent Technologies Inc. introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. The new M8000 Series BER test solution provides accurate and reliable results that accelerate insight into the performance margins of high-speed digital devices.

Auriga Microwave is exhibiting at EuMW 2013, in booth #D104. On display will be Auriga's AU4850, a pulsed IV/RF characterization system, and its fourth generation component test system: CTS-4.