Articles Tagged with ''test''

NI introduces test solutions for 802.11ac WLAN and Bluetooth low-energy

National Instruments introduced test solutions for 802.11ac WLAN and Bluetooth low-energy technology that combine NI graphical system design software and modular, FPGA-based PXI instrumentation to provide high-performance test capabilities that are completely user-programmable. These test solutions along with other cellular, navigation and wireless connectivity solutions from NI, help engineers thoroughly test their devices on a single high-performance platform.


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Anritsu enables public safety community with portfolio of Band 14 LTE device test solutions

Anritsu Co. announces that its full portfolio of LTE device test solutions includes Band 14 capability to support the public safety community. This portfolio includes three LTE-capable test platforms, as well as two LTE-focused test systems. Applications for these solutions cover the complete LTE device development chain from functional test to PTCRB certification and aftermarket repair, and options for advanced functionality, such as Voice over LTE (VoLTE) and LTE Advanced/Carrier Aggregation, are available.


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Anritsu Co. introduces LTE FDD Band 22 and LTE TDD Band 42/43 test software for radio com. analyzer

Anritsu Co. introduces software options for its MT8820C radio communication analyzer that allows the one-box tester to perform testing of LTE FDD Band 22 and LTE TDD Band 42/43 LTE smartphones and mobile terminals. The extended functionality enhances the capability of the MT8820C, which can be used to test all mobile communications technologies, and allows the inherent cost and time efficiencies associated with the MT8820C to be realized in the development of LTE FDD Band 22 and LTE TDD Band 42/43 LTE phones and devices.


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National Instruments introduces world’s first RF vector signal transceiver

National Instruments introduced the world’s first RF vector signal transceiver (VST), the NI PXIe-5644R, and with it, a new class of software-designed instrumentation. This software-centric architecture represents a new era in which engineers and scientists can use LabVIEW to tailor open, field-programmable gate array (FPGA)-based hardware for their specific needs.


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Agilent provides new application note on voice over LTE

The Agilent Power of X application notes provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments. The new “Solutions for Enabling Fast, Accurate and Efficient Testing of Voice Quality in LTE User Equipment (UE)” 5991-0794EN, available now, offers information into how to best address the long list of test requirements when testing the voice quality of LTE UE with the right VoIP test building blocks.


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