Articles Tagged with ''test''

AWT Global introduces portable PIM testers with extended Tx power range

AWT Global has launched a new line of portable passive intermodulation (PIM) testers with an extended carrier power range: the PIM+ series. These systems are equally suited for testing macro cells as well as outdoor and in-building DAS installations. While 2 x 20 W (2 x 43 dBm) carrier power is the reference for standard for PIM test systems, the new PIM+ offers an extended adjustable power range of +15 dBm to +44 dBm for each carrier.


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TI's tiny AFEs shrink test and measurement, wireless communications, optical networking systems

Texas Instruments Inc. introduced two analog front ends (AFEs) that provide low power, high performance and space savings for test and measurement, wireless communications and optical networking equipment. The AFE7071 is a complete radio transmitter that reduces board space by up to 80 percent compared to discrete implementations. It integrates a dual digital-to-analog converter (DAC), tunable baseband filters, IQ modulator and digital quadrature modulation correction circuit.


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inTEST launches THERMOSTREAM ATS Series

inTEST Corp., an independent designer, manufacturer and marketer of temperature management products and semiconductor automatic test equipment (ATE) interface solutions, announced that its Thermal Solutions Group has launched the industry’s most comprehensive line of Precision Temperature Forcing Systems, the THERMOSTREAM® ATS Series. With temperature range extremes as high as +300ºC (+570ºF) and as low as -100ºC (-148ºF), countless test and conditioning applications can now be solved with a compact, precise and portable system.


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Agilent extends high-performance noise-figure measurement technique to 50 GHz

Agilent Technologies Inc. announced the extension of its source-corrected noise-figure measurement capability in PNA-X network analyzers to 43.5 and 50 GHz, while continuing to maintain the highest noise-figure measurement accuracy in the industry. Built directly into the Agilent PNA-X, the technique provides a complete single-connection, multiple-measurement capability for R&D and manufacturing engineers developing and testing low-noise transistors, amplifiers, frequency converters and transmit/receive modules.


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