Anritsu Co. (Booth 542) will display leading-edge test solutions for emerging 5G, satellite and signal integrity applications while highlighting its vector network analyzer (VNA) cutting-edge technology during IMS2019 in Boston, June 4-6. The global test leader will display solutions that meet the testing requirements to verify chipsets, components and systems associated with today’s high speed, high frequency commercial and military applications.
Highlighting Anritsu’s high frequency test leadership will be a demonstration featuring the VectorStar VNA. During IMS, Anritsu will showcase the VectorStar in the microwave industry’s first broadband system that supports 70 GHz to 220 GHz in a single sweep. It will be the first public showing of the solution, with the official launch of the VectorStar 220 GHz system slated for later in 2019.
Continuing its VNA leadership, Anritsu will introduce a 43.5 GHz frequency option for its 2- and 4-port ShockLine VNAs with guaranteed specifications using Anritsu’s new Extended-KTM type connectors and components. With the option, the ShockLine family is the first VNA to support specified 43.5 GHz functionality in a K-connector environment, creating distinct cost-of-test and time-to-market advantages in high-frequency applications.
With the introduction of the Extended-K calibration kits and accessories, the option eliminates the need to use inconvenient adaptors or completely change to the more expensive and cumbersome 2.4 mm connector type. It provides design and manufacturing engineers with an efficient solution that adds the critical 3.5 GHz to a test environment for verification of products used in emerging 5G applications.
Extended-K Brings Cost Efficiency
IMS2019 will also be the unveiling of the Extended-K connector family. The components achieve 43.5 GHz mode-free performance due to careful management of mechanical specifications, such as placement and tolerances of the support bead and pin depth, on the connector design. Mechanical airlines were used to characterize the various components to establish traceability through a national standards body to verify measurement credibility. While the Extended-K will be integrated with the ShockLine family at IMS, the components are test instrument agnostic so they can be used in any VNA-based test environment.
Advanced Testing Technologies Sessions
Anritsu will also help move high-frequency technology forward with its participation in multiple sessions throughout IMS. On Monday, June 3, Dr. Alexander Chenakin, Director R&D of Anritsu, will host a workshop on Low Phase Noise Oscillator and Frequency Synthesizer Techniques. This course will also feature a paper from Dr. Nikolay Shtin, Development Engineer at Anritsu. On the same day, Dr. Jon Martens will present a paper entitled Calibration, Synchronization and Sensitivity Topics in OTA Array Characterization as part of the Measurement Challenges in Over-The-Air Testing workshop. Both sessions start at 8:00 a.m.
Anritsu will discuss emerging trends during the MicroApp Seminar (Booth 200) during IMS, as well. R&D Program Manager Suresh Ojha will present a seminar entitled Signal Source Needs for Measuring High Gain Systems, Important Considerations for Achieving Meaningful Data at 1:30 p.m. on Tuesday, June 4. Senior Product Manager Steve Reyes will participate in the Differential Noise Figure Measurements Using a VNA seminar at 10:15 a.m. on Wednesday, June 5.
The VNA leadership of Anritsu will continue at the 93rd ARFTG Conference on Friday, June 7. Dr. Martens will present a paper entitled, Differential noise measurements: sensitivities and uncertainties with direct correlation- and balun-based methods, at 3:40 p.m.
