Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. They allow for a simplified architecture and also enable VNAs that are much more cost effective. It is shown that NLTL technology results in miniature VNA reflectometers that provide enhanced performance over broad frequency ranges, and reduced measurement complexity, providing VNA users a unique and compelling solution for their high-frequency measurement needs.
DownloadNext generation radar systems face multiple difficult demands. The pace and variety of new requirements need multi-use/function/mode adaptive radars, to be used for different applications. This whitepaper reviews existing pulse measurement test methods; discusses advantages/limitations; and introduces new test method that takes advantage of high-speed digitizing architecture, offering the industryâ??s highest resolution/timing accuracy level.
DownloadVector Network Analyzers (VNA) are your primary resource when analyzing and characterizing systems and components for RF and Microwave measurements. They are regarded as accurate measuring instruments, however, quantifying the accuracy performance of a VNA in a specific application can be challenging. VNA specifications are a starting point; but, they are based upon very specific calibration and measurement conditions, which are not applicable for many applications.
DownloadIn this guide, the concept of calibration is presented and discussed in detail. Specific topics to be covered include how to configure the VNA for calibration, types of calibration and calibration kits. A minimal amount of calibration mathematics and theory will also be covered.
DownloadThis field brief will discuss phase-matching cables, S-parameter definitions as they apply to cable characterization and other cable parameters such as Phase Shift and Group Delay. Advanced Time-Domain measurements will also be presented as enhancements to the well-known Distance-to-Fault (DTF) techniques. In addition, diagnostic tools like the Smith Chart will be briefly described.
DownloadIn this white paper we look at the impact of calibration downtime during on-wafer testing and discuss how recent advances enable longer time periods between calibrations.
DownloadTesting at millimeter-wave frequencies brings new and different measurement challenges, so minimizing measurement uncertainty is critical in the development of these new technologies. This white paper discusses the challenges associated with millimeter-wave testing and how to optimize your Vector Network Analyzer (VNA) measurement capability to provide the confidence required to make performance/cost tradeoffs.
DownloadThe True Balanced/Differential technique uses two sources to create actual differential and common-mode stimuli, hence the shortened name true-balanceÂ. This white paper offers guidance to signal integrity designers on the differences between these approaches and which one may best fit their need.
DownloadThe Anritsu VectorStars Noise Figure Option 041 enables the capability to measure noise figure (NF), which is the degradation of the signal-to-noise ratio caused by components in a signal chain. The NF measurement is based on a cold source technique for improved accuracy. Various levels of match and fixture correction are available for additional enhancement. VectorStar is the only VNA platform offering a Noise Figure option enabling NF measurements from 70 kHz to 125 GHz. It is also the only VNA platform available with an optimized noise receiver for measurements from 30 to 125 GHz.
DownloadThe Anritsu VectorStar’s Noise Figure – Option 041 enables the capability to measure noise figure (NF), which is the degradation of the signal-to-noise ratio caused by components in a signal chain. The NF measurement is based on a cold source technique for improved accuracy.
DownloadHigher data rates can create challenges for traditional de-embedding techniques. As frequencies approach 70 GHz or even 110 GHz, errors related to fixturing can be greater than those of the “device under test” or DUT.
DownloadDesigners, modelers, and manufacturers of RF and microwave frequency amplifiers used in applications such as radar, wireless communication, or high-speed digital communication systems at either the wafer-level or as a packaged part face many test challenges.
DownloadAccurate measurements are needed to better understand higher order harmonics, as will new challenges related to conductor skin effects and dielectric losses on PC boards, along with the design trade-offs related to choices of vias, stackups, and connector pins.
DownloadSignal Integrity applications commonly utilize balanced/differential transmission lines which are typically characterized using vector network analyzers (VNA). There are two approaches to performing these measurements and the selection of the best method depends on what you need to measure.
DownloadThe Anritsu Option 20 tracking generator provides state of the art features not seen with other competitive hand-held analyzers. This includes capabilities such as 0.1 dB power step size, a wide dynamic range and a power output flatness of ±1 dB.
DownloadThe instantaneous traffic rates at internet data centers have reached 1 Tbit/s and device interconnects are becoming transmission bottlenecks. Assuring signal integrity at high data rates while minimizing cost requires closing the loop of simulation and measurement during the design stage.
DownloadCloud computing, smart phones, and LTE services are causing a large increase in network traffic. The instantaneous traffic rates at internet data centers have reached 1 Tbit/s. To support this increased traffic, speed of IT equipment – such as those used in high-end services in data centers – must be increased.
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