As the 200 mm wafer test market continues to expand, MPI Corp. is introducing a new fully automatic wafer probe system. The TS2500-RF addresses multiple production test market requirements which include radio frequency (RF) communication devices and discrete passive components. The system is based on the industry leading and highly reliable automatic LED probe systems from MPI’s Photonic Automation Division with 1000’s of installations worldwide. The TS2500-RF incorporates decades of experience in RF measurement techniques from the management team of MPI’s Advanced Semiconductor Test (AST) Division and leverages AST other products such as RF Probes, RF probing accessories and RF calibration software.
“MPI Corporation has quickly become the innovation leader in our served markets by introducing more than a dozen new products in a span of less than two years”, says Dr. Stojan Kanev, the General Manager of AST Division. “With the TS2500-RF, we are addressing the widely expanding production test market of RF communication devices and discrete RF passive components. We will continue our focus upon innovations and synergies between all MPI divisions to provide maximum value for served markets and to reinforce MPI mission to reduce the overall cost of test.”
Available for both ambient and/or hot temperature operation modes, the TS2500-RF can reach maximum speeds of 10 Dies/second (depends on configuration) which makes it an ideal choice for production electrical tests on discrete RF devices.The unique design of MPI wafer chucks and wafer lift pins can safely handle wafers with thickness down to 50 micrometers and thus enable testing of challenging thin III-Vs compound wafers.Advanced alignment features such as off-axis and chuck mounted upper-looking cameras make the TS2500-RF an ideal platform for testing within complex RF measurement configurations.
The TS2500-RF can be configured with MPI’s advanced RF accessories such as, RF MicroPositioners, RF cables, calibration substrates and TITAN™ RF probes to ensure precise and accurate RF measurements. With integration of the Vector Network Analyzers (VNA) closer to the DUT, the MPI partnership with Rohde & Schwarz, and new advanced calibration techniques,the TS2500-RF fully-automatic probe system becomes a complete measurement solution that addresses the complexities of RF production test.
For more information please visit: www.mpi-corporation.com