— MG3710A eliminates need for multiple generators by featuring dual waveform memory and ability to output four types of modulation signals simultaneously —

Anritsu Company introduces the MG3710A series, a family of innovative vector signal generators that combines high performance and eliminates the need for multiple instruments, thereby reducing operating costs and increasing production yield for designers and manufacturers of multi-system devices and base stations. Its unique design allows the MG3710A to generate test signals based on all leading technologies, including LTE, LTE Advanced, W-CDMA/HSPA, CDMA2000, GSM and PDC, as well as WLAN, Bluetooth^®, and ISDB-T.

Three models are part of the MG3710A series, with frequency coverage from 100 kHz to 2.7 GHz, 4 GHz, or 6 GHz, depending upon the instrument. The MG3710A has two separate built-in RF outputs, each of which allows two modulation schemes to be selected simultaneously, so up to four different RF signals can be generated at one time. The result is that the MG3710A serves as a test source that can produce multiple signals, replacing several expensive signal generators. The ability of the MG3710A to cost-efficiently support multiple RF signals makes it extremely well suited for testing MIMO, Carrier Aggregation, as well as multi-system devices and systems.

The MG3710A has improved ACLR of -71 dBc, which allows tests to be made closer to the device under test (DUT), for more stable measurements and increased production yield. SSB phase noise performance has also been improved to <-131 dBc/Hz (typical). The result is high-quality RF signal output, making the MG3710A well suited for a range of wireless applications extending from wideband mobile phone systems to narrowband communications systems, such as automotive electronics, and digital public and industrial radio.

The MG3710A also has wide vector modulation bandwidth of 120 MHz that can be extended to 160 MHz using an external IQ input, and absolute level accuracy is +/-0.5 dB. High power output of +23 dBm reduces test cost by eliminating the need for an external amplifier, while also reducing the risk of damage to the DUT. Fast switching speed of <600 µs makes the MG3710A well suited for production test environments. Further improving test times is the large 4 GB memory per RF output, which allows multiple waveform data to be loaded for reduced reload and measurement times.

Anritsu has pre-installed waveform patterns of all major standards into the MG3710A, making it easy for engineers of various experience to test LTE, W-CDMA/HSPA, CDMA2000, GSM and PDC, as well as wireless LAN, Bluetooth^®, and ISDB-T. Furthermore, any pattern can be generated using Anritsu’s IQproducer software to output new RF test signals.

The MG3710A has a base U.S. price of $25,200 and delivery is 5 to 7 weeks ARO.