Optimizing D-Band Amplifiers: Diving Into RF Measurement Challenges March 11, 2025 A. Engelmann, Institute for Smart Electronics and Systems (LITES), Friedrich-Alexander-Universität, Erlangen, Germany, B. Derat, Rohde & Schwarz, Munich, Germany, M. Lörner, Rohde & Schwarz, Munich, Germany, and M. Dietz, Fraunhofer Institute, Electronic Microsystems and Solid-State Technology (EMFT), Munich, Germany 0 Comments
Recent Advancements in Terahertz Components Fabrication: A Step Toward Next-Generation Communication Systems March 11, 2025 V. Manimala, Builders Engineering College, Kangayam, India and N. Gunavathi, National Institute of Technology, Trichy, India 0 Comments
Analysis of the Test and Measurement Equipment Market March 11, 2025 Shrikant Mahankar and Kritee Das, MarketsandMarkets, Pune, India 0 Comments
Making Material Measurements with a VNA March 11, 2025 Brian Walker, Copper Mountain Technologies, Indianapolis, Ind. 0 Comments
Sapphire Oscillators Deliver Next-Generation Phase Noise Performance March 11, 2025 Saetta Labs, Boulder, Colo. 0 Comments
Unlocking High Frequency Data Acquisition With a 12-bit Digitizer March 11, 2025 Teledyne SP Devices, Linköping, Sweden 0 Comments
Using Uncertainty Quantification to Predict Reliability in High Frequency Device Design March 11, 2025 COMSOL, Burlington, Mass. 0 Comments
