Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.
Keysight Technologies Inc. unveiled WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.