Items Tagged with 'shockline'

ARTICLES

Anritsu adds signal integrity tools to VNA families

Anritsu Co. continues to address the test needs of signal integrity (SI) engineers with the introduction of options for its VectorStar® and ShockLine™ vector network analyzers (VNAs). The VectorStar Eye Diagram and ShockLine Advanced Time Domain (ATD) options are part of the expanding SI capabilities offered by Anritsu and provide SI engineers with improved tools to conduct channel diagnostics and model validation of high-speed digital circuit designs.


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Anritsu introduces ShockLine VNA solutions to lower test costs

Anritsu Co. introduces an E-band option for its ShockLine™ MS46500B series of 2- and 4-port performance Vector Network Analyzers (VNAs) that addresses the market need to lower cost-of-test for E-band components. With the option installed, the MS46500B series can reduce production costs and more efficiently verify the performance of high-frequency passive components, such as antennas, filters, and duplexers during manufacturing.


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Anritsu Co. extends frequency coverage of ShockLine VNA families to 43.5 GHz

Anritsu Co. announces that it has extended the frequency coverage of its MS46322A Series ShockLine™ Economy Vector Network Analyzers (VNAs) and MS46122A Series ShockLine Compact VNAs to 43.5 GHz. By supporting the higher frequency, the low-cost VNAs can efficiently conduct S-parameter and time domain measurements on RF and microwave passive devices up to 43.5 GHzin a variety of cost-sensitive engineering, manufacturing and university testing applications.


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Vector Network Analyzers: MS46122A Series

Test & Measurement

MS46122AAnritsu Co. expands its ShockLine™ family of vector network analyzers (VNAs) with the introduction of the MS46122A series. Incorporating Anritsu’s patented shock line VNA-on-a-chip technology, the MS46122A low-cost full-reversing 2-port VNAs are packaged in a very compact 1U chassis and are optimized for ultra-cost-sensitive test applicatios in manufacturing, engineering, and education environments.


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