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Rohde & Schwarz has teamed up with IPG Automotive to redefine automotive radar HIL integration testing and thereby reducing the cost by bringing AD testing from the proving ground to the development lab.
Anritsu Co. released a new version of its award-winning SkyBridge Tools™ Test Manager that supports OTDR measurements to establish the industry’s first comprehensive field test automation tool that supports both RF and optical testing. By reducing test time by as much as 90% and increasing accuracy more than 10 times, SkyBridge Tools dramatically simplifies network installation verification, allowing contractors to close out projects more efficiently, receive prompt payment, and start new projects faster.
Analog Devices Inc. announced the acquisition of Innovasic Inc., a leading provider of Deterministic Ethernet semiconductor and software solutions. The acquisition adds a suite of multiprotocol Industrial Ethernet solutions and key enabling technologies to ADI’s Smart Automation Solutions portfolio for industrial automation and Industrial Internet of Things (IoT).
Mentor Graphics Corp. announced that it has acquired Berkeley Design Automation Inc. (BDA), a recognized leader in nanometer analog, mixed-signal, and RF circuit verification. With over one hundred customers worldwide, BDA uniquely addresses nanometer circuit design challenges via its Analog FastSPICE™ unified verification platform and exceptional vertical-application expertise. The acquisition of BDA aligns with Mentor’s goal to deliver technologies with superior performance and automation for the growing challenges of Analog/Mixed-Signal (AMS) verification.
The Z-Wave Alliance, an open consortium of leading global companies deploying Z-Wave, the world's largest ecosystem for wireless control products and services, is proud to announce the approval of radio frequency allocations that will bring Z-Wave control and automation to the South Korean market.
By 2018, ABI Research expects annual home automation device shipments to exceed 351 million, growing at a CAGR of 78 percent. ZigBee dominated IEEE 802.15.4 and claimed the top share of node shipments at 4.5 million, narrowly beating out proprietary protocol offerings.
Agilent introduced MIPI™ M-PHY physical layer receiver and transmitter tests with switch automation. The tests are designed to accelerate the turn-on and debug of MIPI M-PHY-based systems and provide design engineers an efficient way to ensure M-PHY devices interoperate with the application processor.
Azimuth Systems Inc., a provider of automated, real-world mobile performance test solutions, announced the availability of its Device Automation & Control (DAC) system, enabling unattended execution of user experience testing on smartphones and other mobile devices. DAC was developed to address the requirements of both lab- and field-based test organizations, providing a common tool set and methodology across test environments.
Texas Instruments Inc. (TI), leading the industry with the most complete wireless connectivity portfolio for embedded applications, announced that the CC2538 is the industry’s first ZigBee® wireless network processor to offer the three most popular ZigBee standards for one end-device (ZigBee Smart Energy™, ZigBee Home Automation™ and ZigBee Light Link™). Now a single end-equipment can support these three standards, offering a seamless user experience with fast switching between each standard making it seem like concurrent operation.
Anritsu Co. released a new version of its award-winning SkyBridge Tools™ Test Manager that supports OTDR measurements to establish the industry’s first comprehensive field test automation tool that supports both RF and optical testing. By reducing test time by as much as 90% and increasing accuracy more than 10 times, SkyBridge Tools dramatically simplifies network installation verification, allowing contractors to close out projects more efficiently, receive prompt payment, and start new projects faster.
Agilent introduced MIPI™ M-PHY physical layer receiver and transmitter tests with switch automation. The tests are designed to accelerate the turn-on and debug of MIPI M-PHY-based systems and provide design engineers an efficient way to ensure M-PHY devices interoperate with the application processor.