Items Tagged with 'probes'

Pasternack, a leading provider of RF, microwave and millimeter wave products, debuts a new line of semi-rigid test probes designed to assist in testing microwave circuits. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, sampling measurements with these probes can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate.

Narda Safety Test Solutionshas launched the new EHP-50F FFT analyzer for low frequency electromagnetic fields.

Tektronix, Inc., the world's leading manufacturer of oscilloscopes, announced the first physical layer transmitter characterization and debug solution for the MIPI M-PHY^® v3.1 specification recently approved by the MIPI® Alliance. The new Tektronix solution includes support for MIPI M-PHY high speed gears 1, 2 and 3, PWM mode (G0-G7), and SYS mode and offers the industry’s lowest noise solution for MIPI M-PHY measurements when used with Tektronix MSO/DPO 70000DX oscilloscopes and P7600 series probes.

 TEGAM, Inc., a leading supplier of innovative microohmmeters introduces five new Kelvin probes.  

Rohde & Schwarz adds the rugged, passive R&S RT ZZ80 broadband probe to its portfolio. This probe offers a bandwidth of 8 GHz. When analyzing electronic circuits, passive broadband probes such as the R&S RT-ZZ80 are a cost-efficient, rugged alternative to active, high bandwidth probes. They are well-suited for testing transmission lines with low impedance (20 Ohm to 100 Ohm).   

Lake Shore announces a new continuously variable temperature (CVT) probe, developed in collaboration with TOYO Corp., that allows for true, continuous unattended wafer probing of a material sample across a range of temperatures. The probes, when used in any Lake Shore probe station, significantly improve reliability of sample measurement.

Agilent Technologies Inc. introduced economical semipermanent solder-in probing solutions for its InfiniiMax III oscilloscope probing system. Engineers can use these accessories forhigh-speed digital system design, component design/characterization and differential serial bus measurements.