Items Tagged with 'mesuro'

Mesuro launches a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.

Mesuro has launched a new test solution that utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments.

Following the completion of a £700,000 funding round to expand its overseas sales and device characterization capabilities, Mesuro has announced the enhanced services and capabilities it is now able to offer its customers

Mesuro, the Cardiff University spin-out, which offers testing and services solutions for the semiconductor industry, has announced successful completion and installation of its Open Loop Active Harmonic Load Pull system at Miyoshi Corp., Itami, Japan. This system represents the company’s first success in what it sees as the potentially lucrative Japanese market.

Mesuro, the Cardiff University spin-out that offers testing and services solutions for the semiconductor industry, announced completion of a £700k funding round to expand its overseas sales and device characterisation capabilities.