Items Tagged with 'noise'

ARTICLES

Keysight integrates low-frequency noise measurements in wafer level solution platform

Keysight Technologies Inc. announced the newest release of its high-performance, Advanced Low-Frequency Noise Analyzer (A-LFNA), which is designed to make fast, accurate and repeatable low-frequency noise measurements. The release features a new user interface and tight integration with Keysight’s WaferPro Express software—a platform that performs automated wafer-level measurements of semiconductor devices.


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Pasternack expands lines of coaxial packaged noise sources to 60 GHz

Pasternack, a leading provider of RF, microwave and millimeter wave products, has greatly expanded their lines of coaxial packaged noise sources covering frequency bands up to 60 GHz. Various types of noise source design configurations are available including octave band and broadband noise sources, amplified noise sources, noise sources with integral isolators, and precision calibrated instrumentation grade noise sources.


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Keysight’s low-frequency noise measurement system adopted by China CEPREI Lab

Keysight Technologies, Inc. announced that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer(A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.


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Keysight selects Fraunhofer EMFT as its first low-frequency noise reference center

Keysight Technologies Inc. announced that Fraunhofer Research Institution for Microsystems and Solid State Technologies EMFT (Fraunhofer EMFT) is the first low-frequency noise measurements reference center able to demonstrate the Keysight EEsof EDAs E4727A Advanced Low-Frequency Noise Analyzer in Europe, the Middle East, Africa and India (EMEAI).


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