Items Tagged with 'interconnect'

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Smiths_PR_Volta

Volta Series Probe

Smiths Interconnect announces the release of the Volta Series probe heads optimized for wafer level chip scale package testing. Volta is used for testing the chips (while in their wafer form) that are behind everything from Bluetooth and power management to digital display controllers. Volta helps customers deliver higher quality products by ensuring the chips in them are up to specification, and perform as they should.


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Maury Microwave appoints new Director of Sales, Interconnects

Maury Microwave Corp., a global leader in calibration, interconnect, measurement and modeling device characterization solutions, announced that John Clinton has joined the company as Director of Sales, Interconnect. With more than 30 years of industry experience, Clinton will champion the Company’s cable and connector business, building upon the year-over-year growth the company has realized since entering this market space.


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