Featured White Papers

Application Note: Improving R&S®FSWP Measurement Speed

For automated test applications, measurement time is often as important as the quality of the measurement. In practice, phase noise measurements are generally not considered fast, but test engineers still desire to save as much test time as possible. With this paper you get a modern, digital signal processing based, phase-noise test set that performs many tasks in parallel in an effort to improve measurement speed.

Time Domain Analysis with a VNA

A Vector Network Analyzer (VNA) natively measures complex S-parameters of a device under test (DUT) in the frequency domain mode by sweeping across various frequency points. While there is an exhaustive list of measurements that can be accomplished in the standard frequency domain mode – using the advanced inverse Chirp z-transformation, the measurements can also be simultaneously analyzed in the time domain mode. This gives the added advantage where the two fundamental modes of analysis can be performed by one single instrument.

Advanced Methods for Analyzing Ultra Wide Automotive Radar Signals

Review of different ways to overcome the challenges of RF measurements in the E band for ultra wide signals. It will look at the demodulation, analysis of a wideband automotive radar signal and discuss the results and main performance parameters.

Solving the Challenge of Many Devices with Multiple Standards in the Connected Home

Qorvo's ConcurrentConnect™ technology delivers seamless operation of IoT devices that are connected via different networks without performance loss. Its multi-standard capabilities fluently and continuously service multiple networks using different protocols, e.g. Zigbee + CHIP or Zigbee + Bluetooth® Low Energy to a smartphone, or other multi-network protocol use cases.

LoRa® Connectivity Made Smarter with Low-power, Front-end Modules

LoRa, short for long range, is a low-power wide-area networking (LPWAN) technology operating in unlicensed ISM bands that is rapidly gaining traction within the internet of things (IoT). Devices deployed on LoRaWAN networks follow the LoRaWAN protocol specification as defined by the LoRa Alliance®, a technology alliance of more than 500 members.

Key Parameters for Selecting RF Inductors

RF inductor selection involves a number of key parameters including, mounting (surface mount or through-hole), inductance value, current rating, DC resistance (DCR), self-resonant frequency (SRF), Q factor, and temperature rating. While small size is typically desired, the laws of physics limit how small an inductor can be for a given application. Inductance value and current rating are the chief determinants of size. Once they have been calculated, other parameters can be optimized.

Automated ADAS Test System Trial with Radar Sensors and Electromagnetic Interference

Most ADAS functions rely on radar sensors, and these safety-critical components must function correctly even under the most demanding of RF environments. This white paper describes a test procedure to replicate real life scenarios where the ADAS radar functions are activated during EMS testing and it contains some very interesting results.

Making History: Advanced System in a Package Technologies Enable Direct RF Conversion

RF data conversion systems are experiencing rapid changes as ADC and DAC performance specifications and form factors, along with new sensor technologies (Rx & Tx), continue to advance. One system level design problem has been consistent throughout—balancing the implementation tradeoffs between the analog and digital circuitry for maximum software/system flexibility (from sensor to the digital processing units’ input/output).

Application Note: Electronic Warfare Signal Generation Technologies and Methods

Get better signal generation for electronic warfare in multi-emitter environments. Our flexible, high-fidelity solutions offer an alternative that will help you with accuracy and productivity. Download the EW Signal Generation application note today to learn about new technological approaches.

How to Speed Up Large-Scale EM Simulation of ICs Without Comprising Accuracy

Accurate modeling and fast simulation of integrated passives on chips with growing RF content is critical. Read this Cadence white paper to learn how you can get highest-in-class accuracy and 10X faster EM simulation with foundry-certified technology.