Find Events

or

Single Insertion Testing of Asymmetric TX/RX SerDes Interfaces with High-Density Loopback Relays

Registration

Register For This Event

When

5/7/25 11:00 am to 12:00 pm EDT

Event Description

Technical Education Webinar Series

Title: Single Insertion Testing of Asymmetric TX/RX SerDes Interfaces with High-Density Loopback Relays

Date: May 7, 2025

Time: 8am PT / 11am ET

Sponsored by: RFMW and Menlo Micro

Presented by: Stewart Yang, Systems Engineering Manager, Menlo Micro

Abstract:
Sponsored by Menlo Micro and RFMW, this webinar will explore the process of single insertion testing for asymmetric TX/RX SerDes interfaces, utilizing the Menlo Micro Dual DP3T relay with integrated high-density loopback relays. This solution is ideal for high-speed applications such as PCIe Gen5/6, CXL, USB/Thunderbolt, and Ethernet, offering precise control and reliable performance in demanding environments.

The session will provide a detailed overview of testing complex SerDes interfaces, focusing on the challenges and methodologies for controlling both TX and RX differential pairs, including asymmetric signal flows. Key topics will include optimizing high-speed testing for frequencies up to 20 GHz, simplifying test setups, and reducing testing complexity. Attendees will gain practical insights into fixture design, PCB design parameters, and techniques to minimize impedance discontinuities. The webinar will also cover the differential signaling scheme, eye diagram test setup and conditions, and a comparison of measured eye-diagram performance versus simulation results. Additionally, we will demonstrate how the combination of PCIe 6.0 loopback and differential DP3T MEMS switches ensures optimal eye height and width, without the need for pre-emphasis or equalization.

Presenter Bio:
Stewart Yang is a key member of Menlo Micro's Application Engineering team, where he plays a crucial role in supporting customer designs and driving product development. With extensive experience in the semiconductor industry, Stewart has worked with major global accounts, providing expertise at the device level across a range of technologies, including xDSL, 802.11, microwave backhaul, and satellite front-end systems. He holds a Bachelor’s Degree in Electrical Engineering from Hanyang University in South Korea.

Please Note: By registering for this webinar, the details of your profile may be used by Microwave Journal®, the presenter and the sponsors to contact you by email.